Journal of Zhejiang University SCIENCE
(ISSN 1009-3095, Monthly)

2003   Vol. 4   No. 4   p.448-453


Reliability Analysis of DOOF for Weibull Distribution

CHEN Wen-hua(陈文华)(The State Key Laboratory of Fluid Power Transmission and Control, Zhejiang University, Hangzhou 310027, China)
CUI Jie(崔杰)(The State Key Laboratory of Fluid Power Transmission and Control, Zhejiang University, Hangzhou 310027, China)
FAN Xiao-yan(樊小燕)(The State Key Laboratory of Fluid Power Transmission and Control, Zhejiang University, Hangzhou 310027, China)
LU Xian-biao(卢献彪)(Hangzhou Electrical Connector Factory, Hangzhou 310015, China)
XIANG Ping(相平)(Hangzhou Electrical Connector Factory, Hangzhou 310015, China)

Abstract:Hierarchical Bayesian method for estimating the failure probability under DOOF by taking the quasi-Beta distribution as the prior distribution is proposed in this paper. The weighted Least Squares Estimate method was used to obtain the formula for computing reliability distribution parameters and estimating the reliability characteristic values under DOOF. Taking one type of aerospace electrical connector as an example, the correctness of the above method through statistical analysis of electrical connector accelerated life test data was verified.
Keywords:DOOF data, Hierarchical Bayesian estimate, Reliability analysis

CLC Number:TB114.3 Document ID:A

Foundation Item:Project(No.59975081) supported by the National Natural Science Foundation of China
Author Resume:CHEN Wenhua(陈文华),E-mail: chen-wenhua@sohu.com

References:

[1]Anderman, M.; Baker, C.; Cohen, F, 1997. LEO test data for 81 Ah FNC cells, Energy Conversion Engineering Conference, 1: 131 -136.
[2]Bailey, T.,1997. Estimation from Zero-Failure Data, Risk Analysis, 17: 375-380.
[3]Berger, J.Q., 1985. Statistical Decision Theory and Bayesian Analysis. New York.
[4]Chen, Wenhua; Chen, Yaodong; Li, Pingzhen; Lu, Xianbiao, 1997. Reliability mathematics model of aerospace electrical connector. A journal of aeronautics, 1: 732-734. (In Chinese)
[5]GJB101-86, 1986. Connectors Electrical Circular Minature Quick Disconnect Environment Resisting General Specipication For. Science and technology polytechnic committee of national defense. (In Chinese)
[6]Liu, Fuhan; Lu, Jicun; Sundaram, V.; Sutter, D.; White, G.; Baldwin, D.F, 2001. Reliability assessment of microvias in HDI printed circuit boards. Electronic Components and Technology Conference, 51: 1159 -1163.
[7]Mao, S.S.; Xia, J.F.; Guan, W.Q, 1993. Zero-failure data treating of bearing life-testing experiment. Mathematical statistics and Applied probability, 9: 326-332. (In Chinese)
[8]Mao, S.S; Wang, L.L., 1996. Reliability analysis for Weibull zero failure data. Applied probability and statistics, 1: 95-107. (In Chinese)
[9]Pugh, R.L, 1993. Space Transportation Main Engine reliability demonstration technique. Reliability and Maintainability Symposium, p.173 -180.
[10]Sandoh, H.; Sawada, K, 1991. Reliability demonstration testing for discrete-type software products. Reliability and Maintainability Symposium, p.428 -432
[11]Wei, Wen, 2002. Statistical analysis of space-flight electrical connector for vibration reliability. A dissertation for the degree of Master, Hangzhou, Zhejiang University. (In Chinese)
[12]Zhang, Z.Z. Yang, Z.H., 1989. Data treating under zero-failure. Mathematical statistics and Applied probability, 4: 507-516. (In Chinese)


Manuscript Received:2002 Oct. 21

Manuscript Revised:2002 Jan. 8

Published:2003 Aug. 30