Journal of Zhejiang University SCIENCE A
ISSN 1673-565X(Print), 1862-1775(Online), Monthly

2008   Vol. 9   No. 2   p. 289~292

Lattice type transmission line of negative refractive index

Xin HU^1,2, Sailing HE^‡1,2

(¹Center for Optical & Electromagnetic Research, Zhejiang University, Hangzhou 310058, China)
(²Division of Electromagnetic Engineering, School of Electrical Engineering, Royal Institute of Technology, S-10044 Stockholm, Sweden)
^‡ Corresponding Author
E-mail: xinhu@kth.se; sailing@zju.edu.cn
Received Nov. 25, 2007; revision accepted Jan. 10, 2008

Abstract: In this letter, we introduce a novel passive transmission line of negative refractive index (i.e., left-handedness) based on identical symmetrical lattice type structures [thus called “lattice type transmission line” (LT-TL)]. The dispersion characteristic and the transmission response of the proposed LT-TL are analyzed. While all the other left-handed passive transmission lines are of high pass, the present passive left-handed transmission line is of low pass. Compared with a conventional transmission line, the LT-TL has a phase shift of 180( in the entire wide pass-band.

Key words: Negative refractive index (NRI), Transmission line (TL), Symmetrical lattice, Low pass
doi:10.1631/jzus.A0720086             CLC number: O44

References:

[1] Eleftheriades, G.V., Iyer, A.K., Kremer, P.C., 2002. Planar negative refractive index media using periodically L-C loaded transmission lines. IEEE Trans. on Microwave Theory & Tech., 50(12):2702-2712.

[2] Hu, X., He, S., 2007. A new class of negative refractive index transmission line. J. Zhejiang Univ. Sci. A, 8(8):1179- 1182.

[3] Iyer, A.K., Eleftheriades, G.V., 2002. Negative Refractive Index Metamaterials Supporting 2-D Waves. Proc. IEEE Int. Microwave Symp. Digest. Seattle, WA, USA, 2:1067- 1070.

[4] Scott, R.E., Essigman, M.W., 1960. Linear Circuits. Part 1: Time-Domain Analysis. Chapter 5. Addison Wesley.

[5] Veselago, V.G., 1968. The electrodynamics of materials with simultaneously negative values of ε and µ. Sov. Phys. Usp., 10(4):509-514.